Chemical Instrumentation: A Systematic ApproachWiley, 22 feb 1989 - 1248 pagine The Third Edition of this established work on chemical instrumentation has been completely rewritten and updated to account for the advances made since the Second Edition came out in 1973. More main methods of measurement are presented, and there is extended coverage of chromatography and electrochemistry. Most of the material is new--including coverage of microprocessors and microcomputers, statistical control of measurement quality, quantification and extraction of information, x-ray fluorescence spectrometry, surface spectrometric techniques, and chromatography and HPLC. The quality and range of the worked examples have been improved, and there are end-of-chapter exercises. |
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Risultati 1-3 di 69
Pagina 495
... beam splitter ( broken line ) establishes the sample beam and reference beam . The chop- per blocks the sample beam while light is going through the reference beam and vice versa . The beams are recombined just before entering the ...
... beam splitter ( broken line ) establishes the sample beam and reference beam . The chop- per blocks the sample beam while light is going through the reference beam and vice versa . The beams are recombined just before entering the ...
Pagina 595
... beam or alter its diameter . Good coupling calls for keeping the beam from being unnecessarily broadened , absorbed , or distorted . Commonly mirrors , lenses , and other optical elements are coated with dielectric layers of appropriate ...
... beam or alter its diameter . Good coupling calls for keeping the beam from being unnecessarily broadened , absorbed , or distorted . Commonly mirrors , lenses , and other optical elements are coated with dielectric layers of appropriate ...
Pagina 615
... beam splitter SP . Beam width is limited by the diameter of mirrors and beam splitter as well as any diaphragm ( not shown ) placed in the path . The incident beam is divided into two rays by beam - splitter layer SP , which is a ...
... beam splitter SP . Beam width is limited by the diameter of mirrors and beam splitter as well as any diaphragm ( not shown ) placed in the path . The incident beam is divided into two rays by beam - splitter layer SP , which is a ...
Sommario
Measurement and Instrumentation | 1 |
BASIC ELECTRONICS | 21 |
Analog Electrical and Electronic Modules | 57 |
Copyright | |
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Chemical Instrumentation: A Systematic Approach Howard A. Strobel,William R. Heineman Visualizzazione estratti - 1989 |
Parole e frasi comuni
absorbance absorption addition amplifier analysis analyte angle appears applied atomic beam bits called cell charge circuit compared components concentration constant curve defined detector determined developed device diode direction discussed dispersion effect electronic elements emission energy equation error example excited filter frequency Further gain gate give given grating important incident increase input integrated intensity interference lamp laser light limit measurements method mirror mode modules monochromator needed noise Note obtained occurs op-amp operation optical output peak polarized positive possible precision prism pulse radiation range rays reference reflection refractive region relative representative resistance resolution response result sample scanning scattering selected shown shown in Fig signal slit solution spectral spectrometer spectrum standard Table transition usually vibrational voltage wave wavelength