VLSI Testing: Digital and Mixed Analogue/digital Techniques

Copertina anteriore
Institution of Electrical Engineers, 1998 - 532 pagine

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.

Dall'interno del libro

 

Sommario

Introduction
1
Faults in digital circuits
19
Digital test pattern generation
43
Copyright

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VLSI Testing: Digital and Mixed Analogue/digital Techniques
Stanley Leonard Hurst
Anteprima limitata - 1998

Parole e frasi comuni

aliasing analogue circuits analogue macros analogue test applied array Berger code BILBO register bit stream Boolean boundary scan built-in self test built-in self-test CALBO cells Chapter check bits checker circuit under test clock CMOS code words combinational logic complex conference on Test considered controllability and observability cost data input detection digital circuits error exclusive-OR fault coverage fault model Fault tolerant fault-free gate hardware hence I/Os IEEE international conference IEEE Trans input test vectors involved latches LFSR memory MISR mixed-signal node on-chip parity partition polynomial possible primary inputs primary outputs primitive polynomial Proceedings of IEEE programmable logic arrays reconfigurable redundancy scan chain scan path scan test self-test sequence sequential shift register shown in Figure signal signature analysis silicon area simulation specific stuck-at fault switches techniques test data test mode test pattern test set test strategies testable vendor VHDL VLSI voltage

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Informazioni sull'autore (1998)

Stanley L. Hurst began his industrial career with Westinghouse Brake and Signal Company before leaving for academia in the 1960s. Initially with the Bristol College of Science and Technology and subsequently with the University of Bath, he specialised in digital electronic teaching and research, particularly in custom microelectronics and testing. In 1985 he was recruited by the Open University to produce educational material on these subjects for industry and continuing education courses. He is currently Academic Editor, Circuits and Systems, of the Microelectronics Journal. He holds the MSc(Eng) and PhD from the University of London, the DSc from the University of Bath, and is the author of some 50 papers and eight books in his subject area.

Informazioni bibliografiche

TitoloVLSI Testing: Digital and Mixed Analogue/digital Techniques
Volume 9 di IEE circuits and systems series
Volume 9 di IEE circuits and systems series: Institution of Electrical Engineers
Volume 9 di Materials, Circuits and Devices Series
AutoreStanley Leonard Hurst
Edizioneillustrata, ristampa
EditoreInstitution of Electrical Engineers, 1998
Provenienza dell'originalela University of Michigan
Digitalizzato10 dic 2007
ISBN0852969015, 9780852969014
Lunghezza532 pagine
  
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