Chemical Instrumentation: A Systematic Approach to Instrumental AnalysisAddison-Wesley Publishing Company, 1960 - 653 pagine |
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Pagina 71
... incident upon a boundary be- tween dielectrics across which there is a change in refractive index , reflec- tion occurs . The quality of the surface has much to do with the nature of the phenomenon . The usual law of equal angles of ...
... incident upon a boundary be- tween dielectrics across which there is a change in refractive index , reflec- tion occurs . The quality of the surface has much to do with the nature of the phenomenon . The usual law of equal angles of ...
Pagina 77
... incident . ( a ) Reflection from particle whose dimensions are greater than 2. ( b ) Scattering by particle whose dimensions are smaller than 3X / 2 . TABLE 4-1 STRUCTURES PRODUCING SCATTERING Maximum particle size Incident radiation ...
... incident . ( a ) Reflection from particle whose dimensions are greater than 2. ( b ) Scattering by particle whose dimensions are smaller than 3X / 2 . TABLE 4-1 STRUCTURES PRODUCING SCATTERING Maximum particle size Incident radiation ...
Pagina 224
... incident beam , r is the distance from the center of the scattering solution to the detector , and Io the incident intensity ( of vertically po- larized illumination ) . The value of I , at 90 ° is usually termed Rayleigh's ratio for ...
... incident beam , r is the distance from the center of the scattering solution to the detector , and Io the incident intensity ( of vertically po- larized illumination ) . The value of I , at 90 ° is usually termed Rayleigh's ratio for ...
Sommario
THE SCIENCE OF INSTRUMENTATION | 1 |
ERRORS OF MEASUREMENT | 14 |
CHAPTER 3 | 37 |
Copyright | |
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Chemical Instrumentation: A Systematic Approach to Instrumental Analysis Howard A. Strobel Visualizzazione estratti - 1960 |
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absorbance absorption acid activity addition allow amplifier analysis angle applied atoms band beam capacitor cathode cell charge circuit complex components concentration conductance constant curve dependence desired detector determined device direction discussed dispersion drop effect electrical electrode electrolysis energy error example field filter frequency give given glass greater grid incident increase indicator intensity interest ions known light limited lines means measurement mercury metal method mixture molecules negative Note observed obtained occurs operation optical output plate polarized positive possible potential precision present prism procedure produced radiation range reaction reduced reference reflection refractive region relative representative resistance response result sample scattering sensitivity shown signal slit solution species standard substance surface Table temperature tion titration tube usually varies voltage wave wavelength