Chemical Instrumentation: A Systematic Approach to Instrumental AnalysisAddison-Wesley Publishing Company, 1960 - 653 pagine |
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Pagina 81
... layer FIG . 4-16 . Cross section of an interference filter . Thicknesses are exaggerated for clarity . The cover glasses may be from 2 to 3 mm thick , the dielectric layer 0.4 μ , and the metallic films even thinner . Representative ...
... layer FIG . 4-16 . Cross section of an interference filter . Thicknesses are exaggerated for clarity . The cover glasses may be from 2 to 3 mm thick , the dielectric layer 0.4 μ , and the metallic films even thinner . Representative ...
Pagina 107
... layer of CaF2 of 330 mp thickness is used as the spacer between semi- reflecting layers in an interference filter . At what wavelength is the second - order transmission region of the filter ? Where do the first- and third - order bands ...
... layer of CaF2 of 330 mp thickness is used as the spacer between semi- reflecting layers in an interference filter . At what wavelength is the second - order transmission region of the filter ? Where do the first- and third - order bands ...
Pagina 294
... layer of ions in the solu- tion . Proceeding outward from this layer , there is a steady decrease in the excess of the oppositely charged ions until the bulk of the solution is reached . Actually , the potential drop is not uniform but ...
... layer of ions in the solu- tion . Proceeding outward from this layer , there is a steady decrease in the excess of the oppositely charged ions until the bulk of the solution is reached . Actually , the potential drop is not uniform but ...
Sommario
THE SCIENCE OF INSTRUMENTATION | 1 |
ERRORS OF MEASUREMENT | 14 |
CHAPTER 3 | 34 |
Copyright | |
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Chemical Instrumentation: A Systematic Approach to Instrumental Analysis Howard A. Strobel Visualizzazione estratti - 1960 |
Parole e frasi comuni
absorbance absorption acid amplifier analysis analyzed angle anode applied atoms band beam Beer's law calibration calomel capacitance capacitor cathode cell Chem chemical circuit components concentration conductance constant coulometric curve detection detector determined device diffusion diode dispersion drop effect electrical electrode electrolysis emission end point energy error example filter frequency galvanometer gas chromatography glass grid incident input instrument intensity ionization ions layer liquid measurement mercury metal meter method mixture molecules obtained operation optical optical rotation output oxidized particles pH meter photometer phototube plate current platinum polarized polarographic potential potentiometer precision prism procedure quantitative radiation range reaction reflection refractive index region resistance resistor result rotation sample sawtooth wave scattering schematic Section sensitivity shown in Fig signal slit solution solvent species spectra spectrophotometer spectrum standard substance techniques temperature thyratron tion titration transistor triode variable vibrational voltage wave wavelength