Chemical Instrumentation: A Systematic Approach to Instrumental AnalysisAddison-Wesley Publishing Company, 1960 - 653 pagine |
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Pagina 71
... reflected ray . If conditions are right for total reflection , only the latter appears . 4-4 Reflection . Whenever radiation is incident upon a boundary be- tween dielectrics across which there is a change in refractive index , reflec ...
... reflected ray . If conditions are right for total reflection , only the latter appears . 4-4 Reflection . Whenever radiation is incident upon a boundary be- tween dielectrics across which there is a change in refractive index , reflec ...
Pagina 73
... reflection loss are suggested below . Multiple reflection . An intimately associated phenomenon is that of multiple internal reflection . In a slab of dielectric these cannot be avoided although they may be minimized , allowed for , or ...
... reflection loss are suggested below . Multiple reflection . An intimately associated phenomenon is that of multiple internal reflection . In a slab of dielectric these cannot be avoided although they may be minimized , allowed for , or ...
Pagina 74
... reflection coating by interference is shown diagrammatically . Any wave that emerges from the front of the coating after reflection at the coating - medium 2 interface will have traveled one - half wavelength more than a wave of the ...
... reflection coating by interference is shown diagrammatically . Any wave that emerges from the front of the coating after reflection at the coating - medium 2 interface will have traveled one - half wavelength more than a wave of the ...
Sommario
THE SCIENCE OF INSTRUMENTATION | 1 |
ERRORS OF MEASUREMENT | 14 |
CHAPTER 3 | 34 |
Copyright | |
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Chemical Instrumentation: A Systematic Approach to Instrumental Analysis Howard A. Strobel Visualizzazione estratti - 1960 |
Parole e frasi comuni
absorbance absorption acid amplifier analysis analyzed angle anode applied atoms band beam Beer's law calibration calomel capacitance capacitor cathode cell Chem chemical circuit components concentration conductance constant coulometric curve detection detector determined device diffusion diode dispersion drop effect electrical electrode electrolysis emission end point energy error example filter frequency galvanometer gas chromatography glass grid incident input instrument intensity ionization ions layer liquid measurement mercury metal meter method mixture molecules obtained operation optical optical rotation output oxidized particles pH meter photometer phototube plate current platinum polarized polarographic potential potentiometer precision prism procedure quantitative radiation range reaction reflection refractive index region resistance resistor result rotation sample sawtooth wave scattering schematic Section sensitivity shown in Fig signal slit solution solvent species spectra spectrophotometer spectrum standard substance techniques temperature thyratron tion titration transistor triode variable vibrational voltage wave wavelength