Chemical Instrumentation: A Systematic ApproachWiley, 22 feb 1989 - 1248 pagine The Third Edition of this established work on chemical instrumentation has been completely rewritten and updated to account for the advances made since the Second Edition came out in 1973. More main methods of measurement are presented, and there is extended coverage of chromatography and electrochemistry. Most of the material is new--including coverage of microprocessors and microcomputers, statistical control of measurement quality, quantification and extraction of information, x-ray fluorescence spectrometry, surface spectrometric techniques, and chromatography and HPLC. The quality and range of the worked examples have been improved, and there are end-of-chapter exercises. |
Dall'interno del libro
Risultati 1-3 di 71
Pagina 495
... beam splitter ( broken line ) establishes the sample beam and reference beam . The chop- per blocks the sample beam while light is going through the reference beam and vice versa . The beams are recombined just before entering the ...
... beam splitter ( broken line ) establishes the sample beam and reference beam . The chop- per blocks the sample beam while light is going through the reference beam and vice versa . The beams are recombined just before entering the ...
Pagina 595
... beam or alter its diameter . Good coupling calls for keeping the beam from being unnecessarily broadened , absorbed , or distorted . Commonly mirrors , lenses , and other optical elements are coated with dielectric layers of appropriate ...
... beam or alter its diameter . Good coupling calls for keeping the beam from being unnecessarily broadened , absorbed , or distorted . Commonly mirrors , lenses , and other optical elements are coated with dielectric layers of appropriate ...
Pagina 833
... beam and consequent high lateral resolution in elemental analysis . Also , AES is fast , in part because its electron beam is as many as six orders of magnitude more intense than the photon beam in XPS . This high intensity also ensures ...
... beam and consequent high lateral resolution in elemental analysis . Also , AES is fast , in part because its electron beam is as many as six orders of magnitude more intense than the photon beam in XPS . This high intensity also ensures ...
Sommario
Measurement and Instrumentation | 1 |
Operational Amplifier Circuits | 4 |
BASIC ELECTRONICS | 21 |
Copyright | |
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Chemical Instrumentation: A Systematic Approach Howard A. Strobel,William R. Heineman Visualizzazione estratti - 1989 |
Parole e frasi comuni
absorbance absorption amplifier amplitude analyte analytical signal angle atomic band beam Beer's law bits capacitor cell Chem circuit components concentration constant curve detector device diagram differential diffraction diffraction grating diode dispersion electrical electronic elements emission energy ensure equation error example excited exit slit feedback filter flame flip-flop fluorescence frequency gate grating incident input instrument integrated integrated circuit intensity interference lamp laser limit measurements method microprocessor mirror mode modules molecules monochromator noise Ohm's law op-amp operation operational amplifier optical output voltage p-n junction peak photodiode photomultiplier photon polarized precision prism pulse R₁ R₂ radiation Raman range reflection refractive index region resistance resistor resolution result sample scanning Section shown in Fig signal slit width spectral spectrometer spectrophotometer spectrum standard stray light temperature transistor transition tube V₁ variable vibrational wave wavelength wavenumber zener diode