Chemical Instrumentation: A Systematic ApproachAddison-Wesley Publishing Company, 1973 - 903 pagine |
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Pagina 830
... ions are removed from the source by repulsion from positively charged repeller plates that drive the ions into the mass analyzer . Chemical ionization is a second , increasingly important mode of ionization in which a compound to be ...
... ions are removed from the source by repulsion from positively charged repeller plates that drive the ions into the mass analyzer . Chemical ionization is a second , increasingly important mode of ionization in which a compound to be ...
Pagina 832
... ion . For ions traveling a distance d between the ion source and the detector , the time of flight t is : 1 1/2 m t = d.v = d 2V e ( 30.15 ) The time of arrival of ions produced at to is therefore a function of the m / e ratio of the ion ...
... ion . For ions traveling a distance d between the ion source and the detector , the time of flight t is : 1 1/2 m t = d.v = d 2V e ( 30.15 ) The time of arrival of ions produced at to is therefore a function of the m / e ratio of the ion ...
Pagina 834
... ions in an electrostatic analyzer . Only ions previously accelerated by E2 volts pass through the exit slit at the right . That is , the location of a slit at the end of the sector defines an orbit that can be achieved only by ions with ...
... ions in an electrostatic analyzer . Only ions previously accelerated by E2 volts pass through the exit slit at the right . That is , the location of a slit at the end of the sector defines an orbit that can be achieved only by ions with ...
Sommario
Measurement and Instrumentation | 1 |
Basic Electrical Variables | 25 |
9 | 47 |
Copyright | |
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absorbance absorption amplitude analysis analyzer angle anode applied atoms beam Beer's law capacitance capacitor cathode cell circuit of Fig components concentration constant coulometry curve detection detector determined device diagram differential diode dispersion drop electrical electrode electrolysis emission emitter energy equation example excited feedback filter flame fluorescence frequency grating impedance incident input instrument intensity ionization ions magnetic measurement mercury meter method module molecular molecules monochromator noise obtained Ohm's law operational amplifier optical output voltage oxidation p-n junction peak phase photometer photomultiplier polarized polarography potential potentiometer precision prism proton pulse R₁ R₂ radiation range ratio RC circuit readout redox reduced refractive index resistance resistor resonance result sample scan schematic Section sensitivity shown in Fig signal slit solution species spectral spectrometer spectrophotometer Spectroscopy spectrum substance techniques temperature Thévenin equivalent titration transistor tube V₁ vibrational wave wavelength Wheatstone bridge width ΚΩ