Chemical Instrumentation: A Systematic ApproachAddison-Wesley Publishing Company, 1973 - 903 pagine |
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Pagina 246
... reflection applies only in the case of regular reflection from a smooth surface , called specular reflection . Irregular surfaces give rise to diffuse reflection , of little interest in optical work . For most angles of incidence and ...
... reflection applies only in the case of regular reflection from a smooth surface , called specular reflection . Irregular surfaces give rise to diffuse reflection , of little interest in optical work . For most angles of incidence and ...
Pagina 248
... reflected losses . Two general means are used to reduce reflection when it is undesirable . Optical elements that are in contact , such as those in achromatic lenses , are cemented with a material of similar refractive index ( rather ...
... reflected losses . Two general means are used to reduce reflection when it is undesirable . Optical elements that are in contact , such as those in achromatic lenses , are cemented with a material of similar refractive index ( rather ...
Pagina 261
... reflected ; conversely , the component vibrating parallel to ( or in ) the plane of incidence is somewhat selectively refracted . As shown in the figure , for reflection from a dielectric there is a polarizing angle Å , for which the ...
... reflected ; conversely , the component vibrating parallel to ( or in ) the plane of incidence is somewhat selectively refracted . As shown in the figure , for reflection from a dielectric there is a polarizing angle Å , for which the ...
Sommario
Measurement and Instrumentation | 1 |
Basic Electrical Variables | 25 |
9 | 47 |
Copyright | |
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Parole e frasi comuni
absorbance absorption amplitude analysis analyzer angle anode applied atoms beam Beer's law capacitance capacitor cathode cell circuit of Fig components concentration constant coulometry curve detection detector determined device diagram differential diode dispersion drop electrical electrode electrolysis emission emitter energy equation example excited feedback filter flame fluorescence frequency grating impedance incident input instrument intensity ionization ions magnetic measurement mercury meter method module molecular molecules monochromator noise obtained Ohm's law operational amplifier optical output voltage oxidation p-n junction peak phase photometer photomultiplier polarized polarography potential potentiometer precision prism proton pulse R₁ R₂ radiation range ratio RC circuit readout redox reduced refractive index resistance resistor resonance result sample scan schematic Section sensitivity shown in Fig signal slit solution species spectral spectrometer spectrophotometer Spectroscopy spectrum substance techniques temperature Thévenin equivalent titration transistor tube V₁ vibrational wave wavelength Wheatstone bridge width ΚΩ